
Why do metallographic specimens need to be embedded? And listen to Ke Mai's editor explain:
1. Some samples are already small, and even have angles, thicknesses, etc. To observe their microstructure potential, it is necessary to grind and polish their surfaces. Both manual and automatic polishing require sufficient holding/clamping area and volume. Especially for automatic grinding and polishing, in order to be economical and applicable, various fixtures cannot be customized indefinitely. Standardized fixtures are more popular among users, which in turn means that the sample should be embedded into standard blocks for more convenient application.
2. Some materials are relatively expensive, and when used for analysis and testing, only the size and location sufficient to display the microstructure can be cut, so sampling is also very small.
3. Some samples are typical structural types, such as connector inserts, and the gap and depth of the contact surface need to be observed. This type of structural component must be kept intact, so suitable inlay materials need to be used for overall embedding.
4. Some materials require complete surface organization during observation, and even structural defects are the target of observation. If the edges of the sample are deformed or damaged due to stress during the grinding and polishing process, the effectiveness of observation is lost. Therefore, it is necessary to protect the edges of the sample before grinding and polishing.
5. Some sample materials are very brittle, while others have pores or cracks naturally in the organizational structure or due to manufacturing processes. To prevent the force applied during the grinding and polishing process from damaging the sample, suitable materials must be infiltrated into the organization to provide structural support.
6. Mixed hardness materials not only have different wear resistance among various materials themselves, but also often have a combination structure of multiple materials. When the hard material has not yet been ground and polished in place, and gaps may have appeared around the boundary between soft and hard materials, they must be filled and supported to continue grinding and polishing.
7. If SEM and TEM analysis are required for non conductive samples, it is necessary to add conductive properties to the observed surface of the sample.
8. Some samples need to be tested for hardness comparison, and a comparison object needs to be provided for the samples.
9. Some samples may have a darker color, and in order to see the macroscopic effect of polishing during the polishing process, a transparent background is required around them.
10. For the convenience of storage and identification, some samples need to be color marked outside the observed sample surface.
11. Some samples even require a permanent label to be attached, and this label is required to be sealed in the sample, only for destructive removal.
Based on the above various requirements, inlay has become an important preparation step in metallographic research& Flash; Use appropriate methods and inlay materials to embed the sample and form a properly sized sample block, and then proceed with the next grinding and polishing operation.
Next issue preview: QMAXIS metallographic specimen inlay technology exchange - can metallographic specimens not be inlaid? Stay tuned!
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