Dark-field microscopy is often used to observe defects in metal materials.

    Dark-field microscopy technology is to use oblique illumination to block the direct light passing through the details of the specimen, and observe the specimen with reflected light and diffracted light. When direct light passes through the specimen under an ordinary microscope, some of the light is absorbed and the other part is transmitted or refracted, forming a true projection of the internal structure of the specimen's details. Therefore, what can be seen under an ordinary microscope is the shape and structure of the object. Under the Dark-field microscopy, the light beam that shines from the side to the object causes the profile of the object by diffraction or reflection. So what we can see under the Dark-field microscopy is only the outline of the object or the movement of the object.

    Extremely small objects can be seen under the Dark-field microscopy. The objects in this range are called sub particles, so the Dark-field microscopy can also be called the crack limit microscope.

    Well, the principle of the Dark-field microscopy will be shared here first. If you want to know more about other principles of the microscope, please contact the QMAXIS engineer!