Today, qmaxis' partners are invited by quanxun's engineers to provide professional maintenance and service for their Leica electron microscope sample preparation products.

No, after making an appointment with the customer, our partners came to the customer on time at the agreed time, and we are duty bound to provide professional maintenance and service for the customer.

The equipment maintained for customers this time is Leica EM TXP Leica precision grinding machine - electron microscope sample preparation and inspection machine

Leica EM TXP Leica precision polishing machine is a unique high-difficulty sample surface treatment tool of Leica, which can precisely locate micro targets. The target surface preparation system has the function of fixed-point block polishing, especially suitable for cutting, polishing and other series of processing of samples detected by SEM, TEM, LM and AFM. It is also an efficient sample preparation tool for ion beam grinding technology and ultra-thin slice technology. It can be fitted with a variety of tools, so that the sample can be ground, cut, drilled, ground and polished without transfer. The whole process can be observed and monitored through an integrated stereoscope, saving time and cost. Integrated mirror, sample viewing angle 0° － 60° Adjustable, or perpendicular to the front surface of the sample 90 DEG; Observe and measure the distance with the eyepiece scale. The surface treatment and target detection can be completed without taking out the sample. The integrated automatic program control saves a lot of time for users and greatly improves work efficiency.