The Leica EM TIC 3X Leica three ion beam cutting instrument, the new version, has doubled the cutting speed compared to the previous generation products and greatly improved its practicality. Ion beam cutting is the process of obtaining ion beams excited by an ion gun, which bombard the sample vertically perpendicular to the side of the sample, resulting in high-quality stress free "cutting" cross-sections or polished surfaces. Almost suitable for any material sample, especially for hard, soft, porous, thermosensitive, brittle or heterogeneous multiphase composite materials, obtaining high-quality sample surfaces is a particularly good solution for SEM analysis and AFM detection. Its unique wide field ion beam cutting system is also very suitable for EDS, WDS, Auger, and EBSD analysis. Touch screen control, easy to operate, without the need for special skills. Flexible selection of loading platforms according to needs, achieving personalized configuration. Not only is it an ideal equipment for high-throughput laboratories, but it is also suitable for laboratories commissioned for testing.